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Shimadzu EDX-LE Energy Dispersive X-ray Fluorescence spectrometer Shimadzu EDX-LE Energy Dispersive X-ray Fluorescence spectrometer Shimadzu EDX-LE Energy Dispersive X-ray Fluorescence spectrometer
Shimadzu EDX-LE Energy Dispersive X-ray Fluorescence spectrometer
Shimadzu EDX-LE Energy Dispersive X-ray Fluorescence spectrometer Shimadzu EDX-LE Energy Dispersive X-ray Fluorescence spectrometer

Shimadzu EDX-LE Energy Dispersive X-ray Fluorescence spectrometer

Product Details:

  • Voltage AC 100240 V
  • Capacity Up to 1 kg (sample stage limit)
  • Temperature Range Ambient
  • Measurement Range Na (Sodium) to U (Uranium); ppm to 100% (element-dependent)
  • Model No EDX-LE
  • Automation Grade Semi-Automatic
  • Feature Low running cost, user-friendly interface, rapid screening, non-destructive analysis
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Shimadzu EDX-LE Energy Dispersive X-ray Fluorescence spectrometer Price And Quantity

Shimadzu EDX-LE Energy Dispersive X-ray Fluorescence spectrometer Product Specifications

  • 450 x 500 x 300 mm
  • Ambient
  • Na (Sodium) to U (Uranium); ppm to 100% (element-dependent)
  • Steel, ABS Housing, Shielded Chamber
  • Up to 1 kg (sample stage limit)
  • AC 100240 V
  • LCD Touch Panel Display
  • Semi-Automatic
  • EDX-LE
  • Energy Dispersive X-ray Fluorescence (EDXRF) Spectrometer
  • X-ray Tube, Detector, Sample Chamber, Collimator
  • Typically 0.1 to 0.5 wt% (element-dependent)
  • AC Power
  • Approx. 35 kg
  • Elemental Analysis, RoHS/ELV compliance testing
  • 50/60 Hz
  • Low running cost, user-friendly interface, rapid screening, non-destructive analysis
  • Temperature 1530C, Humidity 80% RH (non-condensing)
  • Typically 60 300 seconds/sample
  • Large sample chamber - accommodates up to 300 mm sample diameter
  • Air-cooled, Rh target, max. 50 kV, 1.0 mA
  • Shimadzu EDX Solutions with automated calibration & RoHS/ELV screening modes
  • Interlock, X-ray shielding, automatic shutoff
  • Supports RoHS, ELV, Halogen-Free Material inspections
  • Elements with atomic number 11 (sodium, Na) to 92 (uranium, U)
  • High-sensitivity Si-PIN semiconductor detector
  • USB, LAN, Printout options
  • Solid, Powder, Film, Liquid (in suitable sample cups)

Product Description

Brand                         Shimadzu

Model                         EDX-LE

Capacity                    10 mm diameter

CAT No                       EDX-LE

Application                Spectroscopy

Typical functions requiring an EDX specialist are automated and therefore samples can be analyzed by a novice. The EDX-LE permits high-speed screening of five RoHS-controlled elements plus chlorine (as an option). EDX-LE takes just 1 minute from the start of measurement to results evaluation (depending on the sample).




Versatile Elemental Analysis

The Shimadzu EDX-LE EDXRF spectrometer is engineered for rapid and non-destructive elemental analysis across a vast spectrum, from sodium (Na) to uranium (U). Its advanced semiconductor detector ensures reliable measurement results whether you are assessing solids, powders, films, or even liquids in appropriate sample cups.


Optimized Workflow and Efficiency

Experience automated calibration, intuitive EDX Solutions software, and fast screening modes specifically geared for RoHS and ELV compliance. The large sample chamber accommodates even bulky materials, enabling high throughput and minimal sample preparation, with typical analysis completed within 60 to 300 seconds per sample.


Robust Safety and Compliance

Safety is paramount with built-in interlock, X-ray shielding, and automatic shutoff. The EDX-LE is fully compliant with RoHS, ELV, and halogen-free material inspection requirements, making it indispensable in industries where regulatory adherence and traceability are essential.

FAQ's of Shimadzu EDX-LE Energy Dispersive X-ray Fluorescence spectrometer:


Q: How does the Shimadzu EDX-LE analyze elemental composition?

A: The EDX-LE uses energy dispersive X-ray fluorescence (EDXRF) technology, where the sample is irradiated with X-rays from a Rh-target tube. The resulting secondary X-rays emitted by elements in the sample are detected by a high-sensitivity Si-PIN semiconductor detector, enabling precise identification and quantification of elements from sodium (Na) to uranium (U).

Q: What sample types can be tested with this spectrometer?

A: This instrument accommodates a wide variety of forms including solid materials, powders, films, and liquids (using appropriate sample cups). Its large chamber enables analysis of samples up to 300 mm in diameter and up to 1 kg in weight, offering versatility for multiple applications.

Q: When is this spectrometer most beneficial to use?

A: The Shimadzu EDX-LE is ideal when rapid, non-destructive elemental analysis or compliance screening (RoHS, ELV, halogen-free) is needed. With quick analysis times (60-300 seconds per sample) and minimal preparation, it is particularly useful in manufacturing, quality control, research labs, and material verification.

Q: Where can I use the Shimadzu EDX-LE, and what are its operating requirements?

A: The EDX-LE is suitable for laboratories and industrial facilities, requiring an ambient temperature of 15-30C and humidity below 80% RH (non-condensing). It operates on AC 100-240 V power and is designed for easy integration into compliance and analytical workflows.

Q: What is the process for performing an analysis with the EDX-LE?

A: Simply prepare your sample (solid, powder, film, or liquid in a cup) and place it in the chamber. Use the LCD touch panel and EDX Solutions software to select measurement settings. The instrument then automates calibration, X-ray exposure, and analysis, delivering quantitative data typically within 1-5 minutes.

Q: How does the EDX-LE support regulatory compliance?

A: The spectrometer includes specialized screening modes for RoHS, ELV, and halogen-free inspections. Automated calibration and software-driven checks ensure measurement precision and traceable documentation, supporting adherence to international material compliance regulations.

Q: What benefits does the Shimadzu EDX-LE offer for routine analysis?

A: Users benefit from low running costs, a straightforward user interface, rapid and accurate screening, non-destructive methodology, and robust safety features. Its automated functions reduce operator workload while ensuring reliable and reproducible analytical results.

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